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Anasys Instruments VESTA wins prestigious R&D 100 Award
14 Aug 2008: Anasys Instruments has won the prestigious R&D 100 award for its new VESTA product, a tool which revolutionizes thermal analysis with its ability to perform “point & click” micro and nano thermal analysis at the push of a button.
Anasys Instruments

Recent articles:

JOFRALOG Data Logging Software Announced For Advanced Signal Multi-scanner
01 Aug 2008: AMETEK Calibration Instruments has announced the launch of JOFRALOG data logging software for its ASM-800 series of advanced signal multi-scanners. The ASM series offers a unique time-saving and automatic solution for the simultaneous calibration of multiple temperature sensors and is designed for use wherever temperature measurement is critical and/or there is a need for traceable calibration documentation.
AMETEK Calibration Instruments
Multi N/C 2100 For TOC/TNb Analysis Of Wastewater, Soil And Sediment
01 Aug 2008: The entry-level multi N/C 2100 catalytic combustion analyser from Analytik Jena UK is ideally suited to simultaneous TOC/TNb analyses of a wide range of effluent, wastewater, soil and sediment samples. Very high combustion temperatures, selective high-sensitivity detectors for carbon and nitrogen, a double furnace configuration and simple-to-use software allow liquid and solid samples and liquids containing particulates to be measured with ease.
Analytik Jena
STA-MS in Energy Research
22 Jul 2008: Increases in heating costs and gasoline prices are making us more and more aware of the fact that crude oil and gas are scarce resources. That is why alternative energy resources, improved extraction technologies and more efficient use of fossil fuels are also in great demand. STA-MS apparatus is an ideal research instrument for this research, enabling simultaneous thermal analysis (TG+DSC) and MS analysis of evolving gases. STA-MS measurement on an oil shale specimen is presented as an example.
NETZSCH-Geratebau GmbH
The new STA 449 F1 Jupiter®: Unlimited Flexibility in Simultaneous Thermal Analysis
22 Jul 2008: Simultaneous Thermal Analysis (STA) is an established method for material characterization which measures mass changes and caloric effects on one sample at the same time using a controlled temperature program. This application note shows measurements on a Fe(OH)SO4 sample that were done using an STA 449 coupled to a mass spectrometer. This is a possible base material for the manufacture of iron oxide particles, which can be used as magnetic storage media or in ferrofluids.
NETZSCH-Geratebau GmbH
An Accomplishment in High-Temperature DSC
18 Jul 2008: The new DSC 404 F1 Pegasus® by NETZSCH is capable of high precision sample analysis across an extremely broad temperature range from -150°C to 2000°C in a number of applications such as ceramics, metals, plastics, and composites.
NETZSCH-Geratebau GmbH
Fascinating Flexibility in Thermal Analysis: The New NETZSCH STA 449 F1 Jupiter®
09 Jul 2008: Simultaneous Thermal Analysis (STA) is the term for the simultaneous application of the methods of Thermogravimetry (TG) and Dynamic Scanning Calorimetry (DSC) to one and the same sample. NETZSCH is again setting a new standard in this area with the introduction of its new STA 449 F1 Jupiter®.
NETZSCH-Geratebau GmbH
Excellent new thermal analysers launched
08 Jul 2008: METTLER TOLEDO’s new Thermal Analysis Excellence Line sets new standards in DSC and TGA. Outstanding ergonomics, simultaneous detection of thermal events and the SmartSens touchscreen terminal are just some of the key innovations that maximise efficiency and increase productivity.
Mettler Toledo (UK)
BIOTECHNICA 2008 ready for take-off as an annual event
01 Jul 2008: This coming October, BIOTECHNICA 2008 will boast a number of changes and new attractions. BIOTECHNICA will focus more on research and product development in every area of biotechnology – from foundation research to equipment, bioinformatics and services, as well as the five areas of application: pharma/medicine, chemical industry, environment, agriculture and food.
Deutsche Messe AG
The Pittsburgh Conference Announces Pittcon® 2009 Call for Papers — August 15, 2008 Deadline
25 Jun 2008: The Pittsburgh Conference released the Call for Papers and the Call for Topics (Conferee Networking Sessions) for Pittcon 2009, the 60th annual Pittcon Conference and Exposition which will be held March 8—13, 2009, McCormick Place South, Chicago, Illinois.
The Pittsburgh Conference
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